Title :
Guest editorial - testing and verification of communication system-on-chip devices
Author :
Gizopoulos, D. ; Aitken, R.C.
Author_Institution :
University of Piraeus
Abstract :
Presents the guest editorial for this issue of the publication.
Keywords :
Built-in self-test; Cost function; Manufacturing; Materials testing; Network-on-a-chip; Performance evaluation; Radio frequency; System testing; System-on-a-chip; Time to market;
Journal_Title :
Communications Magazine, IEEE
DOI :
10.1109/MCOM.2003.1232239
