DocumentCode
782071
Title
Guest editors´ introduction: Speed test and speed binning for complex ICs
Author
Butler, K.M. ; Kwang-Ting Cheng ; Wang, L.-C.
Author_Institution
Texas Instruments
Volume
20
Issue
5
fYear
2003
Firstpage
6
Lastpage
7
Abstract
Presents the guest editorial for this issue of the publication.
Keywords
Automatic testing; Computer science; Debugging; Delay; Electrical engineering; Frequency modulation; Instruments; Logic testing; Test pattern generators; Timing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2003.1232250
Filename
1232250
Link To Document