• DocumentCode
    782117
  • Title

    Achieving at-speed structural test

  • Author

    Pateras, Stephen

  • Volume
    20
  • Issue
    5
  • fYear
    2003
  • Firstpage
    26
  • Lastpage
    33
  • Abstract
    In addition to structural test, BIST offers an alternative low-cost approach to at-speed testing. How should BIST be implemented to address at-speed testing? What issues remain to be solved? How can we deal with multicycle paths and different frequency domains? The author describes BIST implementation techniques to answer these questions.
  • Keywords
    built-in self test; BIST; at-speed structural test; at-speed testing; frequency domains; multicycle paths; Automatic test pattern generation; Built-in self-test; Circuit testing; Clocks; Flip-flops; Frequency domain analysis; Logic testing; Pins; Sequential analysis; Timing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2003.1232253
  • Filename
    1232253
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=782117