Title :
Achieving at-speed structural test
Author :
Pateras, Stephen
Abstract :
In addition to structural test, BIST offers an alternative low-cost approach to at-speed testing. How should BIST be implemented to address at-speed testing? What issues remain to be solved? How can we deal with multicycle paths and different frequency domains? The author describes BIST implementation techniques to answer these questions.
Keywords :
built-in self test; BIST; at-speed structural test; at-speed testing; frequency domains; multicycle paths; Automatic test pattern generation; Built-in self-test; Circuit testing; Clocks; Flip-flops; Frequency domain analysis; Logic testing; Pins; Sequential analysis; Timing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2003.1232253
