Title :
Speed binning with path delay test in 150-nm technology
Author :
Cory, Bruce D. ; Kapur, Rohit ; Underwood, Bill
Abstract :
What would it take to reduce speed binning´s dependency on functional testing? One answer is a structural at-speed test approach that can achieve the same effectiveness as functional testing. The authors of this article offer a formula to relate structural critical-path testing frequency to system operation frequency. They demonstrate that there can be a high correlation between frequencies resulting from structural testing and those resulting from functional testing.
Keywords :
automatic test pattern generation; fault diagnosis; integrated circuit testing; logic testing; ATPG; critical-path testing frequency; path delay test; speed binning; structural at-speed test; stuck-at faults; system operation frequency; Automatic test pattern generation; Delay; Engines; Frequency; Performance evaluation; Robustness; System testing; Temperature; Timing; Voltage control;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2003.1232255
