• DocumentCode
    782198
  • Title

    Radiation Effects on Microcircuits

  • Author

    Messenger, George C.

  • Author_Institution
    Nortronics, a Division of Northrop Corporation Applied Research Department Newbury Park, California
  • Volume
    13
  • Issue
    6
  • fYear
    1966
  • Firstpage
    141
  • Lastpage
    159
  • Abstract
    Microcircuit response to nuclear radiations has become an increasingly important concern over the past year. This discussion will consider transient radiation effects (TRE); a companion discussion will cover space radiation effects. The interesting effects occur in two areas: displacement effects resulting from fast neutron irradiation, and ionizing effects caused by prompt pulses composed of x-rays and ??-rays. Fast neutron degradation of microcircuit performance is dominated by transistor current gain reduction. Current gain degradation in microcircuit transistor elements follows the same laws as current gain reduction in discrete transistors of similar base region design and geometry.
  • Keywords
    Circuit testing; Degradation; Dielectric thin films; Fabrication; Inductors; Neutrons; P-n junctions; Photoconductivity; Radiation effects; X-rays;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1996.4324356
  • Filename
    4324356