DocumentCode
782198
Title
Radiation Effects on Microcircuits
Author
Messenger, George C.
Author_Institution
Nortronics, a Division of Northrop Corporation Applied Research Department Newbury Park, California
Volume
13
Issue
6
fYear
1966
Firstpage
141
Lastpage
159
Abstract
Microcircuit response to nuclear radiations has become an increasingly important concern over the past year. This discussion will consider transient radiation effects (TRE); a companion discussion will cover space radiation effects. The interesting effects occur in two areas: displacement effects resulting from fast neutron irradiation, and ionizing effects caused by prompt pulses composed of x-rays and ??-rays. Fast neutron degradation of microcircuit performance is dominated by transistor current gain reduction. Current gain degradation in microcircuit transistor elements follows the same laws as current gain reduction in discrete transistors of similar base region design and geometry.
Keywords
Circuit testing; Degradation; Dielectric thin films; Fabrication; Inductors; Neutrons; P-n junctions; Photoconductivity; Radiation effects; X-rays;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1996.4324356
Filename
4324356
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