Title :
Space-Radiation Effects in Integrated Circuits
Author :
Hamman, Donald J.
Author_Institution :
Battelle Memorial Institute Columbus, Ohio
Keywords :
Circuits; Conductivity; Crystallization; Degradation; Electrons; Lattices; Life estimation; Microelectronics; Protons; Surface contamination;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1996.4324357
