DocumentCode :
78232
Title :
Optimized Programs for Shaped Conductive Backfill Material of Grounding Systems Based on the FDTD Simulations
Author :
Run Xiong ; Bin Chen ; Bi-Hua Zhou ; Cheng Gao
Author_Institution :
Nat. Key Lab. on Electromagn. Environ. & Electro-Opt. Eng., PLA Univ. of Sci. & Technol., Nanjing, China
Volume :
29
Issue :
4
fYear :
2014
fDate :
Aug. 2014
Firstpage :
1744
Lastpage :
1751
Abstract :
A new transient grounding resistance calculation model is proposed for the finite-difference time-domain (FDTD) method. In FDTD, the perfectly matched layer is backed by the perfect electric conductor (PEC) wall. By stretching the grounding system lifting line to the PEC wall, the grounding system performance is simulated. With this model, a 2-D cylindrical coordinate domain FDTD simulation was carried out to study cylindrically shaped conductive backfill material (SCBM) performance with fine grids. From experimental results, some optimal programs have been derived for SCBM in grounding systems. It is found that a large metal rod size can reduce the SCBM resistance only when the main body conductivity is low, and the reduction effect declines as the conductivity increases. Second, the SCBM resistance is as low as the resistance of a conductor of the same size when the main body conductivity reaches 0.5 S/m. Third, enlarging the SCBM radius can reduce the grounding resistance, and resistance can also be reduced by enlarging the SCBM length when it is less than its effective length. Fourth, the grounding resistance of an SCBM, whose conductivity is linear or parabolic type varied, can be as low as that of a totally high conductivity SCBM.
Keywords :
conductors (electric); earthing; finite difference time-domain analysis; FDTD simulations; finite difference time domain method; grounding systems; perfect electric conductor wall; perfectly matched layer; shaped conductive backfill material; transient grounding resistance calculation model; Computational modeling; Conductivity; Finite difference methods; Grounding; Immune system; Metals; Time-domain analysis; Finite-difference time-domain (FDTD) method; shaped conductive backfill material (SCBM); transient grounding resistance (TGR);
fLanguage :
English
Journal_Title :
Power Delivery, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8977
Type :
jour
DOI :
10.1109/TPWRD.2014.2298411
Filename :
6725693
Link To Document :
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