Title :
Optical Near-Field Probe Integrated With Self-Aligned Bow-Tie Antenna and Electrostatic Actuator for Local Field Enhancement
Author :
Iwami, Kentaro ; Ono, Takahito ; Esashi, Masayoshi
Author_Institution :
Graduate Sch. of Eng., Tohoku Univ., Sendai
Abstract :
Microelectromechanical systems (MEMS)-based near-field scanning optical microscopy (NSOM) probes with a bow-tie antenna structure consisting of two metal triangular electrodes separated by a narrow gap have been designed and fabricated. An electrostatic actuator is integrated on this bow-tie probe to decrease the gap width for enhancing the optical near-field intensity. A self-alignment process based on deep reactive ion etching and wet anisotropic etching is established to fabricate the symmetric bow-tie structure. The static and dynamic actuations of electrostatic actuators are examined. With the mechanical resonance of the antenna structure to lateral direction, NSOM imaging is performed in the visible range, and the subwavelength resolution beyond the diffraction limit of light is demonstrated
Keywords :
bow-tie antennas; electrostatic actuators; near-field scanning optical microscopy; probes; sputter etching; bow-tie antenna; deep reactive ion etching; dynamic actuations; electrostatic actuator; local field enhancement; mechanical resonance; microelectromechanical systems; near-field scanning optical microscopy; optical near-field probe; self-alignment process; static actuation; triangular electrodes; wet anisotropic etching; Electrodes; Electrostatic actuators; Geometrical optics; Integrated optics; Microelectromechanical systems; Optical design; Optical microscopy; Particle beam optics; Probes; Wet etching; Bow-tie antenna; electrostatic actuator; microelectromechanical systems (MEMS); near-field scanning optical microscopy (NSOM); surface plasmon polariton;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2006.879694