Title :
Semiconductor Fast-Neutron Dosimeter with Low Threshold of Sensitivity
Author_Institution :
Battelle Memorial Institute Columbus Laboratories Columbus, Ohio
Keywords :
Biomedical measurements; Biomedical monitoring; Boron; Charge carrier lifetime; Degradation; Lattices; Lithium; Neutrons; Silicon; Temperature;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1967.4324440
