DocumentCode
783320
Title
High-Resolution Beta- and Gamma-Ray Spectrometer
Author
Elad, Emanuel ; Nakamura, Michiyuki
Author_Institution
Lawrence Radiation Laboratory University of California Berkeley, California
Volume
14
Issue
1
fYear
1967
Firstpage
523
Lastpage
531
Abstract
A high-resolution semiconductor beta- and gamma-ray spectrometer is described. The spectrometer consists of a silicon or germanium detector, low-noise field-effect transistor preamplifier, and a linear amplifier. The requirements for the different sections for high-resolution performance are outlined. The detectors used are low-capacitance, low-leakage devices cooled to low temperatures. The preamplifier utilizes the low-noise characteristics of a cooled junction-field-effect transistor. These characteristics are described and several types of FET´s are compared. A single FET, incorporated in a voltage-sensitive input stage, provides an optimum signal-to-noise ratio. Pulse generator resolution of the preamplifier for zero external capacitance is 0.4 keV FWHM (Ge) with a slope of 0.038 keV/pF. Typical resolution obtained in the spectrometer in the low-energy region is 0.7 keV. Recent measurements show that the cooling system is one of the main noise sources of the spectrometer. More than 20% improvement in resolution was observed in preliminary experiments when this noise source was suppressed.
Keywords
Detectors; FETs; Germanium; Low-noise amplifiers; Preamplifiers; Semiconductor device noise; Signal resolution; Silicon; Spectroscopy; Temperature;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1967.4324465
Filename
4324465
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