DocumentCode
783362
Title
Secondary Electron Emission from a Charged Dielectric
Author
Budd, P.A. ; Javidi, B. ; Robinson, J.W.
Author_Institution
Electrical Engineering Department The Pennsylvania State University University Park, Pennsylvania
Issue
3
fYear
1985
fDate
6/1/1985 12:00:00 AM
Firstpage
485
Lastpage
491
Abstract
Charges on the surface of fluorinated-ethylene-propylene affect its secondary electron emission coefficient. Measurements with impact energies exceeding that energy which causes peak emission have been made in regions where the local electric field produced by the surface charge is normal to the surface and in regions where it is oblique. The surface of the 6-mm wide specimen was charged to either 6 or 10 kV. Because the impinging primary beam was deflected by the charged specimen, numerical modeling was used to predict the beam´s impact energy E, impact angle ¿, and the impact point. The formula (E0/E) ncos¿ predicts the coefficient in the region of normal field up to 60° although E0 depends upon the electric field and also on the history of the specimen. Near the edges where the field is obliquie, the measured coefficient departs significantly from what the formula predicts.
Keywords
Charge measurement; Coatings; Computational modeling; Current measurement; Dielectric measurements; Electron emission; Electrooptic deflectors; Energy measurement; Scattering; Surface cracks;
fLanguage
English
Journal_Title
Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
0018-9367
Type
jour
DOI
10.1109/TEI.1985.348771
Filename
4156805
Link To Document