• DocumentCode
    783362
  • Title

    Secondary Electron Emission from a Charged Dielectric

  • Author

    Budd, P.A. ; Javidi, B. ; Robinson, J.W.

  • Author_Institution
    Electrical Engineering Department The Pennsylvania State University University Park, Pennsylvania
  • Issue
    3
  • fYear
    1985
  • fDate
    6/1/1985 12:00:00 AM
  • Firstpage
    485
  • Lastpage
    491
  • Abstract
    Charges on the surface of fluorinated-ethylene-propylene affect its secondary electron emission coefficient. Measurements with impact energies exceeding that energy which causes peak emission have been made in regions where the local electric field produced by the surface charge is normal to the surface and in regions where it is oblique. The surface of the 6-mm wide specimen was charged to either 6 or 10 kV. Because the impinging primary beam was deflected by the charged specimen, numerical modeling was used to predict the beam´s impact energy E, impact angle ¿, and the impact point. The formula (E0/E) ncos¿ predicts the coefficient in the region of normal field up to 60° although E0 depends upon the electric field and also on the history of the specimen. Near the edges where the field is obliquie, the measured coefficient departs significantly from what the formula predicts.
  • Keywords
    Charge measurement; Coatings; Computational modeling; Current measurement; Dielectric measurements; Electron emission; Electrooptic deflectors; Energy measurement; Scattering; Surface cracks;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1985.348771
  • Filename
    4156805