DocumentCode :
783516
Title :
“Split ADC” Calibration for All-Digital Correction of Time-Interleaved ADC Errors
Author :
McNeill, John A. ; David, Christopher ; Coln, Michael ; Croughwell, Rosa
Author_Institution :
Dept. of Electr. & Comput. Eng., Worcester Polytech. Inst., Worcester, MA
Volume :
56
Issue :
5
fYear :
2009
fDate :
5/1/2009 12:00:00 AM
Firstpage :
344
Lastpage :
348
Abstract :
The ldquosplit analog-to-digital converter (ADC)rdquo architecture enables fully digital calibration and correction of offset, gain, and aperture-delay mismatch errors in time-interleaved ADCs. The calibration of M interleaved ADCs requires 2M + 1 half-sized ADCs, a minimal increase in analog complexity. Each conversion is performed by a pair of half-sized ADCs, generating two independent outputs that are digitally corrected using estimates of offset, gain, and aperture-delay errors. The ADC outputs are averaged to produce the ADC output code. The difference of the outputs is used in a calibration algorithm that estimates the error in the correction parameters. Any nonzero difference drives a least-mean-square feedback loop toward zero difference, which can only occur when the average error in each correction parameter is zero. A simulation of a 4 : 1-time-interleaved 16-bit 12-MSps successive-approximation-register ADC shows calibration convergence within 400 000 samples.
Keywords :
analogue-digital conversion; calibration; error correction; least mean squares methods; parameter estimation; all-digital correction; analog complexity; analog-to-digital converter; aperture-delay mismatch errors; error estimation; least-mean-square feedback loop; offset correction; split ADC calibration; successive-approximation-register; time-interleaved ADC; time-interleaved ADC errors; Adaptive systems; analog-digital conversion; calibration; digital background calibration; mixed analog-digital integrated circuits; self-calibrating; time-interleaving;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2009.2019161
Filename :
4895228
Link To Document :
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