DocumentCode :
783551
Title :
Leakage Current Reduction Using Subthreshold Source-Coupled Logic
Author :
Tajalli, Armin ; Leblebici, Yusuf
Author_Institution :
Microelectron. Syst. Lab. (LSM), Swiss Fed. Inst. of Technol. (EPFL), Lausanne
Volume :
56
Issue :
5
fYear :
2009
fDate :
5/1/2009 12:00:00 AM
Firstpage :
374
Lastpage :
378
Abstract :
The performance of subthreshold source-coupled logic (STSCL) circuits for ultra-low-power applications is explored. It is shown that the power consumption of STSCL circuits can be reduced well below the subthreshold leakage current of static CMOS circuits. STSCL circuits exhibit a better power-delay performance compared with their static CMOS counterparts in situations where the leakage current constitutes a significant part of the power dissipation of static CMOS gates. The superior control on power consumption, in addition to the lower sensitivity to the process and supply voltage variations, makes the STSCL topology very suitable for implementing ultra-low-power low-frequency digital systems in modern nanometer-scale technologies. An analytical approach for comparing the power-delay performance of these two topologies is proposed.
Keywords :
CMOS logic circuits; leakage currents; low-power electronics; leakage current reduction; power consumption; power dissipation; static CMOS circuits; static CMOS gates; subthreshold source-coupled logic circuits; ultra-low-power applications; CMOS digital circuits; leakage; source-coupled logic (SCL); subthreshold CMOS; subthreshold SCL (STSCL);
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2009.2019167
Filename :
4895230
Link To Document :
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