Title :
Experience with high-output-resistance MJTC AC-DC transfer standards at high frequencies [multijunction thermal converters]
Author :
Filipski, Piotr S. ; Boecker, Michael
Author_Institution :
Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, Ont., Canada
Abstract :
The heater-thermopile insulation of planar, thin-film, multijunction thermal converters decreases at high frequencies due to the residual conductivity of the silicon chip. This may cause a change in their intrinsic AC-DC transfer difference, as well as an interaction with the measurement circuit, resulting in increased errors of measurements. This paper discusses the sources of these errors and the methods of their reduction. It is postulated that the AC-DC transfer differences of such converters need to be explicitly defined under specific measurement conditions.
Keywords :
calibration; convertors; electric variables measurement; frequency response; measurement errors; thermopiles; transfer standards; AC-DC transfer differences; MJTC AC-DC transfer standards; calibration; electric variables measurement; heater-thermopile insulation; high-output-resistance MJTC; measurement errors; measurement standards; multijunction thermal converters; nanovoltmeter; planar thin-film thermal converters; silicon chip residual conductivity; transfer standard high frequency response; Councils; Frequency conversion; Insulation; Measurement standards; Semiconductor device measurement; Testing; Thermal conductivity; Thermal variables measurement; Transistors; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2003.816852