DocumentCode :
783670
Title :
Dark current analysis and characterization of InxGa1-xAs/InAsyP1-y graded photodiodes with x>0.53 for response to longer wavelengths (>1.7 μm)
Author :
Linga, Krishna R. ; Olsen, Gregory H. ; Ban, Vladimir S. ; Joshi, Abhay M. ; Kosonocky, Walter F.
Author_Institution :
Epitaxx Inc., Princeton, NJ, USA
Volume :
10
Issue :
8
fYear :
1992
fDate :
8/1/1992 12:00:00 AM
Firstpage :
1050
Lastpage :
1055
Abstract :
The dark current properties of InxGa1-xAs photodiodes, where x is varied from 0.53 to 0.82 for extending the long wavelength cutoff from 1.7 to 2.6 μm, are described. Detailed analyses of optoelectrical parameters of In0.82Ga 0.1As photodiodes are presented. Dark current, which is a critical parameter and limits the operation of the photodiode, is analyzed and compared with the experimental values. Typical characteristics of photodiodes with cutoff wavelengths of 1.7 μm (x=0.53), 2.2 μm (x=0.72), and 2.6 μm (x=0.82) are presented. The typical and best values of the dark currents obtained are presented
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; photodiodes; 1.7 to 2.6 micron; III-V semiconductors; InxGa1-xAs-InAsyP1-y; dark current properties; graded photodiodes; long wavelength cutoff; optoelectrical parameters; Dark current; Detectors; Helium; Indium gallium arsenide; Indium phosphide; Lattices; Optical fiber communication; Photodiodes; Photonic band gap; Substrates;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/50.156844
Filename :
156844
Link To Document :
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