Reliability and degradation behavior of highly coherent 1.55 μm long-cavity multiple quantum well (MQW) DFB lasers

Author

Fukuda, Mitsuo ; Kano, Fumiyoshi ; Kurosaki, Takeshi ; Yoshida, Jun-ichi

Author_Institution

NTT Opto-Electron. Labs., Kanagawa, Japan

Volume

10

Issue

8

fYear

1992

fDate

8/1/1992 12:00:00 AM

Firstpage

1097

Lastpage

1104

Abstract

Degradation behavior and reliability of 1.55 μm highly coherent MQW DFB laser with a long cavity are examined and clarified. The increase in spectral linewidth, due to the increase in 1/f noise and internal optical loss and the instability of the side mode, and the changes in FM response, especially the increase in FM efficiency, occur during degradation, e.g. increase in threshold current. In addition to these basic degradations, the degradation behavior of multisection DFB lasers is also clarified from the viewpoint of device characteristics, such as wavelength and tunability. By clarifying these changes in device characteristics, the possibility of long life for long-cavity MQW DFB lasers in optical coherent transmission systems is shown

Keywords

distributed feedback lasers; laser tuning; optical losses; optical modulation; semiconductor junction lasers; semiconductor quantum wells; 1.55 micron; 1/f noise; DFB lasers; FM response; degradation behavior; device characteristics; internal optical loss; long-cavity lasers; multiple quantum well; optical coherent transmission systems; reliability; side mode; spectral linewidth; threshold current; tunability; Aging; Degradation; Indium phosphide; Laser modes; Laser noise; Optical losses; Optical noise; Quantum well devices; Quantum well lasers; Threshold current;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.156850

Filename

156850