DocumentCode :
783744
Title :
Proton-beam writing of poly-methylmethacrylate buried channel waveguides
Author :
Sum, T.C. ; Bettiol, A.A. ; Florea, Catalin ; Watt, F.
Author_Institution :
Sch. of Phys. & Math. Sci., Nanyang Technol. Univ., Singapore
Volume :
24
Issue :
10
fYear :
2006
Firstpage :
3803
Lastpage :
3809
Abstract :
In this paper, the authors report on the fabrication and characterization of poly-methylmethacrylate (PMMA) buried channel waveguides. The waveguides were fabricated using an emerging lithographic technique known as proton-beam writing. Depending on the proton fluence used, two different waveguide-formation mechanisms are possible. Single-mode waveguides with the light confinement occurring at the end of range were fabricated using fluences <75 nC/mm2. The refractive-index profiles of these single-mode waveguides were recovered using the propagation mode near-field method. For fluences >100 nC/mm2, multimode waveguides may also be fabricated with the light confinement occurring beneath the end of range. The compaction of the PMMA surface after proton irradiation was investigated using an atomic force microscope. The propagation losses of these PMMA waveguides were also determined
Keywords :
atomic force microscopy; optical fabrication; optical losses; optical polymers; optical waveguides; photolithography; proton beams; proton effects; refractive index; atomic force microscope; buried channel waveguides; lithography; multimode waveguides; poly-methylmethacrylate; propagation mode near-field method; proton fluence; proton-beam writing; refractive-index profiles; Ion implantation; Optical device fabrication; Optical materials; Optical polymers; Optical refraction; Optical waveguides; Particle beam optics; Physics; Protons; Writing; Compaction; PMMA buried channel waveguides; direct write; near-field mode profiles; propagation mode near-field method; proton-beam writing; refractive-index profiles;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2006.881474
Filename :
1707846
Link To Document :
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