• DocumentCode
    784217
  • Title

    Design of Parasitic and Process-Variation Aware Nano-CMOS RF Circuits: A VCO Case Study

  • Author

    Ghai, Dhruva ; Mohanty, Saraju P. ; Kougianos, Elias

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Univ. of North Texas, Denton, TX, USA
  • Volume
    17
  • Issue
    9
  • fYear
    2009
  • Firstpage
    1339
  • Lastpage
    1342
  • Abstract
    This paper proposes a novel flow for parasitic and process-variation aware design of radio-frequency integrated circuits (RFICs). A nano-CMOS current-starved voltage controlled oscillator (VCO) circuit has been designed using this flow as a case study. The oscillation frequency is considered as the objective optimization function with the area overhead as constraint. Extensive Monte Carlo simulations have been carried out on the parasitic extracted netlist of the VCO to study the effect of process variation on the oscillation frequency. In the design cycle, a performance degradation of 43.5% is observed when the parasitic extracted netlist is subjected to worst-case process variation. The proposed design flow could bring the oscillation frequency within 4.5% of the target, leading to convergence of the complete design in only one design iteration. To the best of the authors´ knowledge, this paper presents the first work focussed on a current starved VCO in which the combined effect of parasitics and process variations has been considered.
  • Keywords
    CMOS integrated circuits; Monte Carlo methods; integrated circuit design; nanoelectronics; radiofrequency integrated circuits; voltage-controlled oscillators; Monte Carlo simulation; nanoCMOS current-starved VCO circuit; objective optimization function; oscillation frequency; parasitic extracted netlist; process-variation aware design; radio-frequency integrated circuit design; voltage controlled oscillator; Monte Carlo; nano-CMOS; process variation;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2008.2002046
  • Filename
    4895291