Title :
Digital techniques in HV tests-summary of 1989 panel session
Author :
McComb, T.R. ; Fenimore, C. ; Gockenbach, E. ; Kuffel, J. ; Malewski, R. ; Schon, K. ; Van der Sluis, L. ; Ward, B. ; Zhang, Y.X.
Author_Institution :
NRC, Ottawa, Ont., Canada
fDate :
10/1/1992 12:00:00 AM
Abstract :
A panel session on digital techniques in high-voltage (HV) tests was held at the IEEE PES Summer Meeting in Long Beach, CA, in 1989. The authors present an outline of the panel session and list pertinent reference material. This panel addressed the question of how signal processing can be used to enhance high voltage tests and extract more information from them. The first part dealt with the evaluation of digitizers and records and the second with the application of digitizers to industrial testing
Keywords :
analogue-digital conversion; high-voltage techniques; signal processing equipment; testing; HV tests; digital techniques; digitizers; industrial testing; signal processing;
Journal_Title :
Power Delivery, IEEE Transactions on
