• DocumentCode
    784573
  • Title

    Bounds on least-squares four-parameter sine-fit errors due to harmonic distortion and noise

  • Author

    Deyst, John P. ; Sounders, T.M. ; Solomon, Otis M., Jr.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    44
  • Issue
    3
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    637
  • Lastpage
    642
  • Abstract
    Least-squares sine-fit algorithms are used extensively in signal-processing applications. The parameter estimates produced by such algorithms are subject to both random and systematic errors when the record of input samples consists of a fundamental sine wave corrupted by harmonic distortion or noise. The errors occur because, in general, such sine-fits will incorporate a portion of the harmonic distortion or noise into their estimate of the fundamental. Bounds are developed for these errors for least-squares four-parameter (amplitude, frequency, phase, and offset) sine-fit algorithms. The errors are functions of the number of periods in the record, the number of samples in the record, the harmonic order, and fundamental and harmonic amplitudes and phases. The bounds do not apply to cases in which harmonic components become aliased
  • Keywords
    analogue-digital conversion; data handling; error analysis; harmonic distortion; least squares approximations; parameter estimation; random noise; signal processing; A/D convertors; amplitude; digital oscilloscopes; frequency; harmonic distortion; least-squares four-parameter; least-squares four-parameter sine-fit errors; linear model; noise; offset; parameter estimates; phase; random errors; signal-processing applications; sine wave; systematic errors; Additive noise; Amplitude estimation; Analog-digital conversion; Frequency estimation; Harmonic distortion; Laboratories; Oscilloscopes; Parameter estimation; Senior members; Solids;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.387298
  • Filename
    387298