Title :
Simultaneous measurement of the resistivity and permeability of a film sample with a double coil
Author :
Nonaka, Yoshihiro ; Nakane, Hiroshi ; Maeda, Takao ; Hasuike, Kiminori
Author_Institution :
Dept. of Electr. Eng., Sci. Univ. of Tokyo, Japan
fDate :
6/1/1995 12:00:00 AM
Abstract :
A method is proposed for a simultaneous measurement of the resistivity and permeability of a film inserted between two coils facing each other. Connecting in series, the total impedance of the coils was measured in two ways, i.e., 1) the current passes through the coils in the same direction, and 2) the current passes through each coil in opposite directions to each other. The resistivity and permeability of the film were simultaneously obtained from the difference in the impedance for the two cases. It was theoretically found that the optimum frequency for high accuracy in the measurement was proportional to the resistivity and inversely proportional to a thickness of a sample film. The results of the simultaneous measurements of the resistivity and permeability of nickel films of a thickness ranging from 0.01-0.08 mm at a frequency range of 1-100 kHz are shown in this paper. The measured values of the resistivity and permeability with this method agreed with the values obtained by conventional methods, i.e., the dc four-probe method for the resistivity measurement and the toroidal coil method for the permeability measurement
Keywords :
electric resistance measurement; magnetic permeability measurement; magnetic thin films; nickel; soft magnetic materials; 0.01 to 0.08 mm; 1 to 100 kHz; Ni; Ni films; dc four-probe; double coil; film sample; optimum frequency; permeability measurement; resistivity measurement; simultaneous measurement; simultaneous measurements; toroidal coil method; Coils; Conductive films; Conductivity; Current measurement; Electrical resistance measurement; Frequency measurement; Impedance measurement; Nickel; Permeability measurement; Thickness measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on