DocumentCode :
785359
Title :
Corrosion of metallic materials
Author :
Tullmin, Martin ; Roberge, Pierre R.
Author_Institution :
Queen´´s Univ., Kingston, Ont., Canada
Volume :
44
Issue :
2
fYear :
1995
fDate :
6/1/1995 12:00:00 AM
Firstpage :
271
Lastpage :
278
Abstract :
Corrosion processes are important in the degradation of electronic components. By nature of thin and closely-spaced metallic sections, electronic components are prone to corrosion failures even in the presence of traces of moisture and contaminants. Atmospheric corrosion, an electrochemical process under the influence of thin-film electrolytes, is primarily responsible for corrosion damage in electronics and can lead to premature failures even in indoor atmospheres. In attempting to minimize the risk of corrosion failures, it is important to account for corrosion damage during the design stage, manufacturing processes, storage, shipping, and in service use. Carefully-designed accelerated corrosion-tests are used to predict the performance of electronic components. Many sensitive analytical techniques and instrumentation are available for determining the mechanism and causes of electronic corrosion failures. Many sources of corrosion information are available for consultation on the performance of candidate materials, but, unfortunately, most are not tailored specifically to the electronics industry
Keywords :
circuit reliability; corrosion; corrosion testing; design engineering; electrochemistry; electron device testing; failure analysis; life testing; accelerated corrosion tests; atmospheric corrosion; contaminants; corrosion failures; corrosion processes; degradation; design; electrochemical process; electronic components; electronics industry; failure mechanisms; instrumentation; manufacturing processes; metallic materials; moisture; performance; thin-film electrolyte; tutorial; Atmosphere; Corrosion; Degradation; Electrochemical processes; Electronic components; Inorganic materials; Manufacturing processes; Moisture; Process design; Transistors;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.387383
Filename :
387383
Link To Document :
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