• DocumentCode
    785771
  • Title

    Analytic expressions for the reflection delay, penetration depth, and absorptance of quarter-wave dielectric mirrors

  • Author

    Babic, Dubravko I. ; Corzine, Scott W.

  • Author_Institution
    Dept. of Electr. & Comput. Sci., California Univ., Santa Barbara, CA, USA
  • Volume
    28
  • Issue
    2
  • fYear
    1992
  • fDate
    2/1/1992 12:00:00 AM
  • Firstpage
    514
  • Lastpage
    524
  • Abstract
    The authors analyze the operation of high-reflectivity quarter-wave (QW) dielectric mirrors at the band-stop center (Bragg) frequency, relevant for the design of small-cavity optoelectronic structures. The energy penetration depth concept is used to determine a first-order linear approximation for the reduction of the mirror peak reflectivity of the QE mirror as a function of the mirror material parameters and the number of layers. The expression can be applied in the limit of small loss. The mathematical analysis and expressions for the absorptance and the peak reflectivity of a dielectric mirror with weak material absorption are presented. The use of the results is illustrated for a typical vertical cavity surface-emitting laser structure
  • Keywords
    laser accessories; light absorption; mirrors; reflectivity; Bragg frequency; absorptance; band-stop center; diode lasers; energy penetration depth; first-order linear approximation; high-reflectivity; laser mirrors; mirror layer number; mirror material parameters; mirror peak reflectivity; peak reflectivity; quarter-wave dielectric mirrors; reflection delay; small loss limit; small-cavity optoelectronic structures; vertical cavity surface-emitting laser structure; weak material absorption; Delay; Dielectric materials; Frequency; Linear approximation; Mathematical analysis; Mirrors; Optical materials; Optical reflection; Reflectivity; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.123281
  • Filename
    123281