DocumentCode
785801
Title
Early-stage power grid analysis for uncertain working modes
Author
Qian, Haifeng ; Nassif, Sani R. ; Sapatnekar, Sachin S.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN, USA
Volume
24
Issue
5
fYear
2005
fDate
5/1/2005 12:00:00 AM
Firstpage
676
Lastpage
682
Abstract
High-performance integrated circuits are now reaching the 100-plus watt regime, and power delivery and power grid signal integrity have become critical. Analyzing the performance of the power delivery system requires knowledge of the current drawn by the functional blocks that comprise a typical hierarchical design. However, current designs are of such complexity that it is difficult for a designer to determine what a realistic worst-case switching pattern for the various blocks would be in order to maximize noise at a specific location. This paper uses information about the power dissipation of a chip to derive an upper bound on the worst-case voltage drop at an early stage of design. An exact integer linear programming (ILP) method is first developed, followed by an effective heuristic to speed up the exact method. A circuit of 43 K nodes is analyzed within 70 s, and the worst-case scenarios found correlate well with the results from an ILP solver.
Keywords
circuit complexity; circuit noise; integer programming; linear programming; network analysis; power supply circuits; early-stage power grid analysis; early-stage simulation; high-performance integrated circuits; integer linear programming; power delivery system; power dissipation; power grid signal integrity; random walk; realistic worst-case switching pattern; supply network; uncertain working modes; worst-case voltage drop; Circuits; Information analysis; Mesh generation; Noise reduction; Performance analysis; Power dissipation; Power generation; Power grids; Semiconductor device noise; Voltage; Early-stage simulation; power grid; random walk; supply network;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2005.846370
Filename
1424171
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