DocumentCode :
786061
Title :
Illumination planning for object recognition using parametric eigenspaces
Author :
Murase, Hiroshi ; Nayar, Shree K.
Author_Institution :
NTT Basic Res. Labs., Kanagawa, Japan
Volume :
16
Issue :
12
fYear :
1994
fDate :
12/1/1994 12:00:00 AM
Firstpage :
1219
Lastpage :
1227
Abstract :
Presents a novel approach to the problem of illumination planning for robust object recognition in structured environments. Given a set of objects, the goal is to determine the illumination for which the objects are most distinguishable in appearance from each other. Correlation is used as a measure of similarity between objects. For each object, a large number of images is automatically obtained by varying the pose and the illumination direction. Images of all objects together constitute the planning image set. The planning set is compressed using the Karhunen-Loeve transform to obtain a low-dimensional subspace, called the eigenspace. For each illumination direction, objects are represented as parametrized manifolds in the eigenspace. The minimum distance between the manifolds of two objects represents the similarity between the objects in the correlation sense. The optimal source direction is therefore the one that maximizes the shortest distance between the object manifolds. Several experiments have been conducted using real objects. The results produced by the illumination planner have been used to enhance the performance of an object recognition system
Keywords :
brightness; correlation methods; correlation theory; data compression; eigenvalues and eigenfunctions; image coding; lighting; object recognition; planning; transforms; Karhunen-Loeve transform; appearance matching; correlation; distinguishability; illumination direction; illumination planning; image compression; low-dimensional subspace; minimum distance; optimal source direction; parametric appearance representation; parametric eigenspaces; parametrized manifolds; planning image set compression; pose invariance; principal component analysis; robust object recognition; similarity measure; structured environments; Brightness; Computer science; Image edge detection; Karhunen-Loeve transforms; Lighting; Machine vision; Object recognition; Reflectivity; Robotic assembly; Robustness;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.387485
Filename :
387485
Link To Document :
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