Title :
A third-order ΣΔ modulator in 0.18-μm CMOS with calibrated mixed-mode integrators
Author :
Shim, Jae Hoon ; Park, In-Cheol ; Kim, Beomsup
Author_Institution :
Electron. & Telecommun. Res. Inst., Daejeon, South Korea
fDate :
4/1/2005 12:00:00 AM
Abstract :
This paper describes a third-order sigma-delta (ΣΔ) modulator that is designed and implemented in 0.18-μm CMOS process. In order to increase the dynamic range, this modulator takes advantage of mixed-mode integrators that consist of analog and digital integrators. A calibration technique is applied to the digital integrator to mitigate mismatch between analog and digital paths. It is shown that the presented modulator architecture can achieve a 12-dB better dynamic range than conventional structures with the same oversampling ratio (OSR). The experimental prototype chip achieves a 76-dB dynamic range for a 200-kHz signal bandwidth and a 55-dB dynamic range for a 5-MHz signal bandwidth. It dissipates 4 mW from 1.8-V supply voltages and occupies 0.7-mm2 silicon area.
Keywords :
CMOS integrated circuits; calibration; mixed analogue-digital integrated circuits; sigma-delta modulation; 0.18 micron; 1.8 V; 200 kHz; 4 mW; 5 MHz; CMOS process; analog integrators; analog-digital conversion; digital integrators; dynamic range; mixed-mode integrators; oversampling ratio; sigma-delta modulation; third-order ΣΔ modulator; Analog circuits; Bandwidth; Calibration; Circuit stability; Delta modulation; Delta-sigma modulation; Digital modulation; Dynamic range; Feedback loop; Voltage; Analog–digital conversion; calibration; sigma-delta modulation;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2005.845558