Title :
A 0.9-V 12-mW 5-MSPS algorithmic ADC with 77-dB SFDR
Author :
Li, Jipeng ; Ahn, Gil-Cho ; Chang, Dong-Young ; Moon, Un-Ku
Author_Institution :
Design Center, Nat. Semicond. Inc., Salem, NH, USA
fDate :
4/1/2005 12:00:00 AM
Abstract :
An ultra-low-voltage CMOS two-stage algorithm ADC featuring high SFDR and efficient background calibration is presented. The adopted low-voltage circuit technique achieves high-accuracy high-speed clocking without the use of clock boosting or bootstrapping. A resistor-based input sampling branch demonstrates high linearity and inherent low-voltage operation. The proposed background calibration accounts for capacitor mismatches and finite opamp gain error in the MDAC stages via a novel digital correlation scheme involving a two-channel ADC architecture. The prototype ADC, fabricated in a 0.18 μm CMOS process, achieves 77-dB SFDR at 0.9 V and 5MSPS (30 MHz clocking) after calibration. The measured SNR, SNDR, DNL, and INL at 80 kHz input are 50 dB, 50 dB, 0.6 LSB, and 1.4 LSB, respectively. The total power consumption is 12 mW, and the active die area is 1.4 mm2.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; high-speed integrated circuits; low-power electronics; 0.18 micron; 0.9 V; 12 mW; 30 MHz; 50 dB; 77 dB; 80 kHz; CMOS two-stage algorithm; background digital calibration; capacitor mismatch; digital correlation scheme; finite opamp gain error; high-speed clocking; low-voltage circuit technique; pipelined ADC; resistor-based input sampling branch; two-channel ADC architecture; ultra-low-voltage ADC; Boosting; CMOS process; Calibration; Capacitors; Circuits; Clocks; Energy consumption; Linearity; Prototypes; Sampling methods; Algorithmic ADC; background digital calibration; low power; low voltage; pipelined ADC; two channel ADC architecture;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2004.842866