DocumentCode :
786420
Title :
Microwave dielectric properties of a silt-loam at high frequencies
Author :
Calvet, Jean-Christophe ; Wigneron, Jean-Pierre ; Chanzy, André ; Raju, Suresh ; Laguerre, Laurent
Author_Institution :
CNRM/GMME, Toulouse, France
Volume :
33
Issue :
3
fYear :
1995
fDate :
5/1/1995 12:00:00 AM
Firstpage :
634
Lastpage :
642
Abstract :
Microwave brightness temperatures at three frequencies (23.8, 36.5, and 90 GHz) of a carefully smoothed silt-loam were measured over a large range of near-surface soil moisture conditions. The microwave data were collected simultaneously with ground observations of soil moisture, soil temperature, and bulk density. The atmospheric downwelling radiation is computed from the French weather forecast model outputs and cloud coverage surface observations. Assuming that roughness effects are negligible for the studied surface, Fresnel coefficients are used to model soil reflectivities. The relationship between soil moisture and soil reflectivity at high frequencies is then analyzed through existing semi-empirical models of the soil complex dielectric permittivity
Keywords :
geophysical techniques; hydrological techniques; microwave measurement; millimetre wave measurement; moisture measurement; radiometry; remote sensing; soil; 23.8 to 90 GHz; Fresnel coefficients; SHF EHF microwave mm wave; complex dielectric permittivity; geology; geophysical measurement technique; high frequencies; hydrology; land surface; loam; microwave brightness temperature; microwave dielectric properties; microwave radiometry; millimetric; remote sensing; semi-empirical model; silt; soil; soil moisture conditions; terrain mapping; Atmospheric measurements; Atmospheric modeling; Brightness temperature; Dielectrics; Frequency; Reflectivity; Rough surfaces; Soil moisture; Surface roughness; Weather forecasting;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on
Publisher :
ieee
ISSN :
0196-2892
Type :
jour
DOI :
10.1109/36.387579
Filename :
387579
Link To Document :
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