DocumentCode
786666
Title
Two-dimensional a-Si:H n-i-p photodiode array for low-level light detection
Author
Vygranenko, Yuri ; Chang, Jeff Hsin ; Nathan, Arokia
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Ont., Canada
Volume
41
Issue
5
fYear
2005
fDate
5/1/2005 12:00:00 AM
Firstpage
697
Lastpage
703
Abstract
This paper presents the design, fabrication process, and performance evaluation of a two-dimensional hydrogenated amorphous silicon (a-Si:H) n-i-p photodiode array, developed specifically for low-level light sensor applications. The design of the device is simpler than conventional active-matrix-arrays based on thin-film transistor (TFT) addressing electronics, owing to the utilization of the a-Si:H switching diodes for signal readout. The discussed technological developments are aimed to minimize the leakage current and to enhance the external quantum efficiency. The current-voltage characteristics of the sensing and switching diodes are analyzed to identify the sources of the excess leakage current. The optical losses in the photodiodes with an ITO/a-SiNx:H antireflection coating have been minimized using numerical modeling. Description of the peripheral electronics and associated timing diagrams along with the results of the detector characterization, including the linearity and response time measurements, are presented and discussed.
Keywords
amorphous semiconductors; antireflection coatings; hydrogen; infrared detectors; leakage currents; optical arrays; optical fabrication; p-i-n photodiodes; photodetectors; silicon; Si:H; a-Si:H n-i-p photodiode array; a-Si:H switching diodes; antireflection coating; external quantum efficiency; hydrogenation; leakage current minimization; signal readout; Amorphous silicon; Diodes; Fabrication; Leakage current; Optical arrays; Photodiodes; Process design; Sensor arrays; Signal design; Thin film transistors; Amorphous semiconductors; leakage current; optical signal detection; photodiodes;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2005.845029
Filename
1424254
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