DocumentCode :
786736
Title :
Hardness of a Dielectric Switch to Ionizing Radiation
Author :
Bartko, J. ; Sauvageot, Robert E.
Author_Institution :
Nuclear Division, Martin Marietta Corporation Baltimore, Maryland 21203
Volume :
14
Issue :
6
fYear :
1967
Firstpage :
217
Lastpage :
220
Abstract :
The effect of transient and steady state radiation on a dielectric switch has been investigated. The dielectric switch is a solid state device which remains, indefinitely, in either a low resistance or a high resistnace state. It trips from the former to the latter by the application of a high current pulse. The reverse procedure is accomplished by a high voltage pulse. For the transient study, pulses from a 55-Mev Linac and 600-kev flash X-rays were used. Gamma rays from a Co-60 source were used for the steady state study. The device appears impervious to a Linac dose rate of 2.4 x 1010 rads (Si)/sec or an X-ray dose rate of 7.47 x 107 rads (Si)/sec. Below a Co-60 dose of 8 x 107 rads, negligible changes in resistance occur but above this level radiation induced switching (on-to-off) occurs as well as increases in resistance. The devices, however, recovered completely after the test was completed. Possible explanations for the responses are offered on the basis of a model developed for device operation.
Keywords :
Dielectric devices; Gamma rays; Ionizing radiation; Linear particle accelerator; Solid state circuits; Steady-state; Switches; Testing; Voltage; X-rays;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1967.4324796
Filename :
4324796
Link To Document :
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