• DocumentCode
    786927
  • Title

    Formulating SoC test scheduling as a network transportation problem

  • Author

    Koranne, Sandeep

  • Author_Institution
    Tanner Res. Inc., Pasadena, CA, USA
  • Volume
    21
  • Issue
    12
  • fYear
    2002
  • fDate
    12/1/2002 12:00:00 AM
  • Firstpage
    1517
  • Lastpage
    1525
  • Abstract
    A formulation of core-based system-on-chip (SoC) test scheduling as a network transportation problem is presented. Given a set of tests, with demands for transportation of test bits (either for test stimuli or test response) and unrelated parallel test resources (e.g., test access mechanisms or built-in self-test engines), the authors determine the start times and resource mappings of all the tests such that the finish time for the complete SoC test is minimized. The problem is NP-hard and they present an approximation algorithm using a result from the solution of the single source unsplittable flow problem. The proposed method uses the number of test bits that need to be transported for a test as the invariant and is hence relatively independent of the test application and execution model. Experimental results on benchmark SoCs demonstrate that their method outperforms the state-of-the-art integer linear programming formulations, not only in terms of schedule quality, but also significantly reduces the computation time.
  • Keywords
    VLSI; approximation theory; automatic test equipment; built-in self test; embedded systems; integrated circuit testing; processor scheduling; system-on-chip; NP-hard problem; VLSI test; approximation algorithm; automatic test equipment; built-in self-test engines; computation time; core-based SoC test scheduling; demands for transportation; embedded core-based test scheduling; execution model; finish time minimization; network transportation problem; parallel test resources; parallel unrelated multiprocessor scheduling; resource mappings; schedule quality; single source unsplittable flow problem; start times; test access mechanisms; test response; test stimuli; Approximation algorithms; Automatic testing; Benchmark testing; Built-in self-test; Engines; Integer linear programming; Processor scheduling; System testing; System-on-a-chip; Transportation;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2002.804382
  • Filename
    1097872