DocumentCode
786927
Title
Formulating SoC test scheduling as a network transportation problem
Author
Koranne, Sandeep
Author_Institution
Tanner Res. Inc., Pasadena, CA, USA
Volume
21
Issue
12
fYear
2002
fDate
12/1/2002 12:00:00 AM
Firstpage
1517
Lastpage
1525
Abstract
A formulation of core-based system-on-chip (SoC) test scheduling as a network transportation problem is presented. Given a set of tests, with demands for transportation of test bits (either for test stimuli or test response) and unrelated parallel test resources (e.g., test access mechanisms or built-in self-test engines), the authors determine the start times and resource mappings of all the tests such that the finish time for the complete SoC test is minimized. The problem is NP-hard and they present an approximation algorithm using a result from the solution of the single source unsplittable flow problem. The proposed method uses the number of test bits that need to be transported for a test as the invariant and is hence relatively independent of the test application and execution model. Experimental results on benchmark SoCs demonstrate that their method outperforms the state-of-the-art integer linear programming formulations, not only in terms of schedule quality, but also significantly reduces the computation time.
Keywords
VLSI; approximation theory; automatic test equipment; built-in self test; embedded systems; integrated circuit testing; processor scheduling; system-on-chip; NP-hard problem; VLSI test; approximation algorithm; automatic test equipment; built-in self-test engines; computation time; core-based SoC test scheduling; demands for transportation; embedded core-based test scheduling; execution model; finish time minimization; network transportation problem; parallel test resources; parallel unrelated multiprocessor scheduling; resource mappings; schedule quality; single source unsplittable flow problem; start times; test access mechanisms; test response; test stimuli; Approximation algorithms; Automatic testing; Benchmark testing; Built-in self-test; Engines; Integer linear programming; Processor scheduling; System testing; System-on-a-chip; Transportation;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2002.804382
Filename
1097872
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