• DocumentCode
    787031
  • Title

    Extended boundary condition method for scattering and emission from natural surfaces modeled by fractals

  • Author

    Franceschetti, Giorgio ; Iodice, Antonio ; Riccio, Daniele ; Ruello, Giuseppe

  • Author_Institution
    Dipt. di Ingegneria Elettronica e delle Telecomunicazioni, Univ. di Napoli "Federico II", " Naples, Italy
  • Volume
    43
  • Issue
    5
  • fYear
    2005
  • fDate
    5/1/2005 12:00:00 AM
  • Firstpage
    1115
  • Lastpage
    1125
  • Abstract
    The extended boundary condition method with the Weierstrass-Mandelbrot fractal function (WM-EBCM) has been recently employed to model and solve the problem of electromagnetic scattering from natural surfaces. In this paper we first of all show, on the basis of theoretical considerations and of numerical examples, that this method can be used also for the evaluation of electromagnetic emission from natural surfaces. In addition, a small roughness approximation of the WM-EBCM solution is presented to highlight the connection between EBCM and SPM, and to avoid matrix ill-conditioning in scattering problems. Achieved results show that the zero-order scattered field is the (deterministic) field reflected by the mean plane, and that the first-order (random) scattered field is directly proportional to surface roughness. Validity limits of the approximated method are discussed and verified by studying the scattered field behavior at different surface roughness conditions.
  • Keywords
    electromagnetic wave scattering; fractals; rough surfaces; Floquet modes; Weierstrass-Mandelbrot fractal function; electromagnetic emission; electromagnetic scattering; extended boundary condition method; first-order scattered field; fractals; matrix ill-conditioning; natural surfaces; roughness approximation; scattering problems; surface roughness; zero-order scattered field; Boundary conditions; Electromagnetic fields; Electromagnetic modeling; Electromagnetic scattering; Fractals; Geology; Rough surfaces; Scanning probe microscopy; Sea surface; Surface roughness; Electromagnetic scattering and emission; Floquet modes; fractals; rough surfaces;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0196-2892
  • Type

    jour

  • DOI
    10.1109/TGRS.2004.839922
  • Filename
    1424289