DocumentCode :
787116
Title :
Levelized incomplete LU factorization and its application to large-scale circuit simulation
Author :
Eickhoff, Karl-Michael ; Engl, Walter L.
Author_Institution :
Inst. fuer Theor. Elektrotech., Tech. Univ. Aachen, Germany
Volume :
14
Issue :
6
fYear :
1995
fDate :
6/1/1995 12:00:00 AM
Firstpage :
720
Lastpage :
727
Abstract :
In the simulation of large circuits, the CPU time for solving the resulting linear equations may exceed the time required for evaluating the circuit elements. The circuit size above which this occurs depends on the applied transistor model and is roughly 104 devices for a vectorizing table model. To further speed up large-scale circuit simulation, one therefore has to focus on the solution algorithm. In this paper the excessive propagation of fill-in elements during sparse matrix factorization is identified as the major source of the superlinear increase of solution time. The idea of truncating the fill-in propagation in a variable manner forms the basis for the construction of a hierarchical solver with the same robustness as Newton´s method but much less effort for large circuits. The method was applied to MOS circuits with up to 63000 transistors and in all cases the predominance of the solution part was broken. The new algorithm can be used efficiently both on sequential and vector architectures
Keywords :
MOS integrated circuits; VLSI; circuit analysis computing; computational complexity; iterative methods; sparse matrices; CPU time; MOS circuits; VLSI architectures; fill-in propagation truncation; hierarchical solver; large-scale circuit simulation; levelized incomplete LU factorization; sequential architectures; sparse matrix factorization; vector architectures; vectorizing table model; Central Processing Unit; Circuit simulation; Large-scale systems; Linear systems; MOSFETs; Newton method; Nonlinear equations; Robustness; Sparse matrices; Vectors;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.387732
Filename :
387732
Link To Document :
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