Title :
Using Bulk Built-in Current Sensors to Detect Soft Errors
Author :
Neto, Egas Henes ; Ribeiro, Ivandro ; Vieira, Michele ; Wirth, Gilson ; Kastensmidt, Fernanda Lima
Author_Institution :
Univ. Estadualdo Rio Grande do Sul
Abstract :
Connecting a built-in current sensor in the design bulk of a digital system increases sensitivity for detecting transient upsets in combinational and sequential logic. SPICE simulations validate this approach and show only minor penalties in terms of area, performance, and power consumption
Keywords :
SPICE; built-in self test; circuit simulation; combinational circuits; integrated circuit design; integrated circuit testing; logic testing; sequential circuits; SPICE simulations; built-in current sensors; combinational logic; digital system design; integrated circuits; power consumption; sequential logic; soft error detection; Circuit faults; Logic devices; Monitoring; Neutrons; Protons; Pulse generation; Registers; SPICE; Signal generators; Silicon; Built-in tests; Error-checking; Reliability; Testing; and Fault-Tolerance;
Journal_Title :
Micro, IEEE
DOI :
10.1109/MM.2006.103
