Title :
MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits
Author :
Nepal, Kundan ; Bahar, R. Iris ; Mundy, Joseph ; Patterson, William R. ; Zaslavsky, Alexander
Author_Institution :
Brown Univ., Providence, RI
Abstract :
Shrinking devices to nanoscale, increasing integration densities, and reducing voltage levels to the thermal limit-all conspire to produce faulty systems. A possible solution is a fault-tolerant probabilistic framework based on Markov random fields. This article introduces a new redundancy element, the MRF reinforcer, which achieves significant immunity to single-event upsets and noise
Keywords :
CMOS logic circuits; Markov processes; circuit noise; fault tolerance; logic design; logic gates; logic testing; nanoelectronics; probability; CMOS logic; MRF reinforcer; Markov random fields; fault-tolerant probabilistic framework; nanoscale circuits; noise; single-event upsets; space redundancy; Circuit faults; Computer errors; Crosstalk; Logic circuits; Probabilistic logic; Probability distribution; Random variables; Redundancy; Reliability; Voting; Markov random fields; Reliability; noise immunity; probabilistic computing; redundancy;
Journal_Title :
Micro, IEEE
