DocumentCode
787857
Title
Ferroelectric polymer Langmuir-Blodgett films for nonvolatile memory applications
Author
Ducharme, Stephen ; Reece, Timothy J. ; Othon, Christina M. ; Rannow, R.K.
Author_Institution
Dept. of Phys., Univ. of Nebraska, Lincoln, NE, USA
Volume
5
Issue
4
fYear
2005
Firstpage
720
Lastpage
735
Abstract
We review the potential for integrating ferroelectric polymer Langmuir-Blodgett (LB) films with semiconductor technology to produce nonvolatile ferroelectric random-access memory (NV-FRAM or NV-FeRAM) and data-storage devices. The prototype material is a copolymer consisting of 70% vinylidene fluoride (VDF) and 30% trifluoroethylene (TrFE), or P(VDF-TrFE 70:30). Recent work with LB films and more conventional solvent-formed films shows that the VDF copolymers are promising materials for nonvolatile memory applications. The prototype device is the metal-ferroelectric-insulator-semiconductor (MFIS) capacitance memory. Field-effect transistor (FET)-based devices are also discussed. The LB films afford devices with low-voltage operation, but there are two important technical hurdles that must be surmounted. First, an appropriate method must be found to control switching dynamics in the LB copolymer films. Second, the LB technology must be scaled up and incorporated into the semiconductor-manufacturing process, but since there is no precedent for mass production of LB films, it is difficult to project how long this will take.
Keywords
Langmuir-Blodgett films; MFIS structures; ferroelectric materials; ferroelectric storage; field effect transistor circuits; low-power electronics; polymer blends; polymer films; random-access storage; Langmuir-Blodgett copolymer films; copolymer material; data-storage devices; ferroelectric polymer Langmuir-Blodgett films; field-effect transistor-based devices; metal-ferroelectric-insulator-semiconductor capacitance memory; nonvolatile ferroelectric random-access memory; semiconductor technology; trifluoroethylene material; vinylidene fluoride; Capacitance; FETs; Ferroelectric films; Ferroelectric materials; Mass production; Nonvolatile memory; Polymer films; Prototypes; Semiconductor films; Semiconductor materials; Ferroelectric memory; Langmuir–Blodgett (LB) films; ferroelectric polymer; nonvolatile memory;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2005.860818
Filename
1573690
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