• DocumentCode
    787914
  • Title

    Stepped electric-field profiles in transit-time tubes

  • Author

    Barroso, Joaquim J.

  • Author_Institution
    Associated Plasma Lab., Nat. Inst. for Space Res., San Jose Dos Campos, Brazil
  • Volume
    52
  • Issue
    5
  • fYear
    2005
  • fDate
    5/1/2005 12:00:00 AM
  • Firstpage
    872
  • Lastpage
    877
  • Abstract
    In its classical embodiment-a circular cylindrical cavity driven by a rectilinear electron beam-the simplest of the transit-time microwave tubes, the monotron, has its conversion efficiency limited to 20.0%. However, we demonstrate here that on considering a stepped electric-field axial profile described by a tanh(z) function, the monotron efficiency can attain the theoretical maximum value of 57.0%, almost three times as high as that obtained from the conventional uniform field distribution. This is accomplished by using two cavities electromagnetically coupled by an annular slit crossed by an electron stream. From a one-dimensional analysis, a two-cavity monotron is developed to operate in the TM010 mode at 4.0 GHz when self-excited by a 20-keV, 10-A hollow electron beam. The device operation is examined through a 2.5-dimensional particle-in-cell (PIC) simulation giving a 47.5% conversion efficiency. Departure from the theoretically predicted efficiency is explained by beam-thickness effects.
  • Keywords
    electron beams; microwave tubes; 10 A; 20 keV; 4 GHz; 47.5 percent; PIC simulation; annular slit; beam-thickness effects; circular cylindrical cavity; electromagnetically coupled cavities; electron stream; hollow electron beam; microwave generation; rectilinear electron beam; stepped electric-field profiles; transit-time microwave tubes; transit-time tubes; two-cavity monotron; Brazil Council; Coupling circuits; Electromagnetic coupling; Electron beams; Electron tubes; Klystrons; Optical coupling; Oscillators; Space technology; Structural beams; Microwave generation; monotron; transit-time tubes;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.845813
  • Filename
    1424371