Title :
Signal X-Y zoning to detect inter-signal delay violations
Author :
Zenteno, A. ; Champac, V.H. ; Figueras, J.
Author_Institution :
Dept. of Electron. Eng., INAOE, Puebla, Mexico
fDate :
7/4/2002 12:00:00 AM
Abstract :
A signal X-Y zoning method to explore the possibilities to test time critical digital signals is presented. X-Y operating zones are obtained using an X-Y detector circuitry. The method has been applied to test delay violations due to crosstalk using a simple floating gate differential weighted-adder-comparator circuit
Keywords :
adders; built-in self test; comparators (circuits); crosstalk; delays; detector circuits; digital signals; BIST; X-Y detector circuitry; X-Y operating zones; crosstalk; delay violations; floating gate differential weighted-adder-comparator circuit; inter-signal delay violations; inter-signal delays; signal X-Y zoning; time critical digital signals;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20020478
