Title :
Global coupled EM-electrical-thermal simulation and experimental validation for a spatial power combining MMIC array
Author :
Batty, William ; Christoffersen, Carlos E. ; Yakovlev, Alexander B. ; Whitaker, John F. ; Mortazawi, Amir ; Al-Zayed, Ayman ; Ozkar, Mete ; Ortiz, Sean C. ; Reano, Ronald M. ; Yang, Kyoung ; Katehi, Linda P B ; Snowden, Christopher M. ; Steer, Michael B.
Author_Institution :
Sch. of Electron. & Electr. Eng., Leeds Univ., UK
fDate :
12/1/2002 12:00:00 AM
Abstract :
A unique electromagnetic (EM)-electrothermal global simulation tool based on a universal error concept is presented. The advantages of this electrothermal model are illustrated by comparison with a commercial electrothermal circuit simulator. The first description of a fully physical, electrothermal, microwave circuit simulation, based on coupling of the Leeds Physical Model of MESFETs and high electron-mobility transistors, to a microwave circuit simulator, fREEDA (NCSU), is presented. The modeling effort is supported by parallel developments in electrooptic and thermal measurement. The first fully coupled EM-electrothermal global simulation of a large microwave subsystem, here a whole spatial power combining monolithic-microwave integrated-circuit (MMIC) array, is described. The simulation is partially validated by measurements of MMIC array temperature rise and temperature dependent S-parameters. Electrothermal issues for spatial power combiner operation and modeling are discussed. The computer-aided-design tools and experimental characterization described, provide a unique capability for the design of quasi-optical systems and for the exploration of the fundamental physics of spatial power combining devices.
Keywords :
HEMT integrated circuits; MESFET integrated circuits; circuit simulation; field effect MMIC; impedance matrix; integrated circuit modelling; power combiners; thermal analysis; EM-electrothermal global simulation tool; HEMT model; Leeds Physical Model; MESFET model; MMIC array temperature rise; coupled EM-electrothermal global simulation; electromagnetic-electrothermal global simulation; electrothermal-microwave circuit simulation; fREEDA microwave circuit simulator; high electron-mobility transistors; monolithic microwave IC array; quasi-optical power combining; spatial power combining MMIC array; temperature dependent S-parameters; thermal modeling; universal error concept; Circuit simulation; Computational modeling; Coupling circuits; Electrothermal effects; HEMTs; Integrated circuit measurements; MESFETs; MMICs; MODFETs; Temperature dependence;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2002.805142