Title :
Increasing image resolution in electrical impedance tomography
Author :
Hou, W.D. ; Mo, Y.L.
Author_Institution :
Dept. of Commun. Eng., Shanghai Univ., China
fDate :
7/4/2002 12:00:00 AM
Abstract :
An effective approach to increase the image resolution in static electrical impedance tomography is proposed, in which the image with local high resolution is reconstructed by fine meshing only the impedance abnormal element in the finite element model based on a genetic algorithm. Experimental results from a laboratory phantom are presented
Keywords :
electric impedance imaging; finite element analysis; genetic algorithms; image reconstruction; image resolution; medical image processing; EIT image; FEM; fine meshing; finite element model; genetic algorithm; image reconstruction; image resolution improvement; impedance abnormal element; local high resolution; static electrical impedance tomography;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20020477
