DocumentCode :
788281
Title :
Influence of Carrier Capture on Resolution of Semiconductor Radiation Counters
Author :
Makovsky, L.L. ; Strokan, N.B. ; Tisnek, N.I.
Author_Institution :
A. F. Ioffe Physico-Technical Institute, USSR Academy of Sciences, Leningrad, USSR
Volume :
15
Issue :
3
fYear :
1968
fDate :
6/1/1968 12:00:00 AM
Firstpage :
304
Lastpage :
309
Keywords :
Charge carrier processes; Counting circuits; Electrodes; Energy capture; Fluctuations; Gaussian distribution; Radiation detectors; Radiative recombination; Semiconductor counters; Spontaneous emission;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1968.4324951
Filename :
4324951
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=788281
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