• DocumentCode
    788281
  • Title

    Influence of Carrier Capture on Resolution of Semiconductor Radiation Counters

  • Author

    Makovsky, L.L. ; Strokan, N.B. ; Tisnek, N.I.

  • Author_Institution
    A. F. Ioffe Physico-Technical Institute, USSR Academy of Sciences, Leningrad, USSR
  • Volume
    15
  • Issue
    3
  • fYear
    1968
  • fDate
    6/1/1968 12:00:00 AM
  • Firstpage
    304
  • Lastpage
    309
  • Keywords
    Charge carrier processes; Counting circuits; Electrodes; Energy capture; Fluctuations; Gaussian distribution; Radiation detectors; Radiative recombination; Semiconductor counters; Spontaneous emission;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1968.4324951
  • Filename
    4324951
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=788281