On the ferromagnetic interlayer coupling in exchange-biased spin-valve multilayers

Author

Kools, J.C.S. ; Rijks, Th.G.S.M. ; De Veirman, A.E.M. ; Coehoorn, R.

Author_Institution

Philips Res. Lab., Eindhoven, Netherlands

Volume

31

Issue

6

fYear

1995

fDate

11/1/1995 12:00:00 AM

Firstpage

3918

Lastpage

3920

Abstract

The ferromagnetic interlayer coupling in sputter-deposited permalloy/copper/permalloy exchange-biased spin valve multilayers has been measured as a function of the copper thickness. The variation with thickness may, for t_cu>1.7 nm, be analyzed in terms of the Neel model for magnetostatic coupling due to correlated interface roughness, using parameters which are consistent with the observed microstructure

Keywords

Permalloy; copper; exchange interactions (electron); ferromagnetic materials; interface structure; magnetic multilayers; sputtered coatings; surface topography; 1.7 nm; Cu thickness; Neel model; Ni₈₀Fe₂₀-Cu-Ni₈₀Fe₂₀; correlated interface roughness; exchange-biased spin-valve multilayers; ferromagnetic interlayer coupling; magnetostatic coupling; microstructure; sputter-deposited permalloy/copper/permalloy exchange-biased spin valve multilayer; Atomic force microscopy; Copper; Couplings; Magnetic films; Magnetic materials; Magnetic multilayers; Magnetostatics; Nonhomogeneous media; Spin valves; Thickness measurement;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.489816

Filename

489816