Title :
On the ferromagnetic interlayer coupling in exchange-biased spin-valve multilayers
Author :
Kools, J.C.S. ; Rijks, Th.G.S.M. ; De Veirman, A.E.M. ; Coehoorn, R.
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
fDate :
11/1/1995 12:00:00 AM
Abstract :
The ferromagnetic interlayer coupling in sputter-deposited permalloy/copper/permalloy exchange-biased spin valve multilayers has been measured as a function of the copper thickness. The variation with thickness may, for tcu>1.7 nm, be analyzed in terms of the Neel model for magnetostatic coupling due to correlated interface roughness, using parameters which are consistent with the observed microstructure
Keywords :
Permalloy; copper; exchange interactions (electron); ferromagnetic materials; interface structure; magnetic multilayers; sputtered coatings; surface topography; 1.7 nm; Cu thickness; Neel model; Ni80Fe20-Cu-Ni80Fe20; correlated interface roughness; exchange-biased spin-valve multilayers; ferromagnetic interlayer coupling; magnetostatic coupling; microstructure; sputter-deposited permalloy/copper/permalloy exchange-biased spin valve multilayer; Atomic force microscopy; Copper; Couplings; Magnetic films; Magnetic materials; Magnetic multilayers; Magnetostatics; Nonhomogeneous media; Spin valves; Thickness measurement;
Journal_Title :
Magnetics, IEEE Transactions on
