DocumentCode :
78858
Title :
High-Speed Oxide Confined 850-nm VCSELs Operating Error-Free at 40 Gb/s up to 85 ^{\\circ}{\\rm C}
Author :
Westbergh, P. ; Safaisini, R. ; Haglund, E. ; Gustavsson, J.S. ; Larsson, A. ; Geen, M. ; Lawrence, Roger ; Joel, A.
Author_Institution :
Department of Microtechnology and Nanoscience, Photonics Laboratory, Chalmers University of Technology, Göteborg, Sweden
Volume :
25
Issue :
8
fYear :
2013
fDate :
15-Apr-13
Firstpage :
768
Lastpage :
771
Abstract :
We present the temperature dependence of the performance characteristics of our latest generation high-speed oxide confined 850-nm vertical cavity surface-emitting lasers (VCSELs). Using a 7- \\mu{\\rm m} oxide aperture diameter VCSEL, we demonstrate a maximum modulation bandwidth of {\\sim}{\\rm 27}~{\\rm GHz} at room temperature and {\\sim}{\\rm 21}~{\\rm GHz} at 85 ^{\\circ}{\\rm C} . With a new high-speed optical receiver, these bandwidths enable error-free data transmission (defined as a bit-error-rate {< }10^{-12} ) at bit-rates up to 47 Gb/s at room temperature, and up to 40 Gb/s at 85 ^{\\circ}{\\rm C} .
Keywords :
Apertures; Bandwidth; Cavity resonators; High-speed optical techniques; Modulation; Photonics; Vertical cavity surface emitting lasers; High-speed modulation; optical interconnects; semiconductor lasers; vertical cavity surface-emitting laser (VCSEL);
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2013.2250946
Filename :
6473828
Link To Document :
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