• DocumentCode
    788643
  • Title

    Estimating testing effectiveness of the circular self-test path technique

  • Author

    Pilarski, Slawomir ; Krasniewski, Andrzej ; Kameda, Tiko

  • Author_Institution
    Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC, Canada
  • Volume
    11
  • Issue
    10
  • fYear
    1992
  • fDate
    10/1/1992 12:00:00 AM
  • Firstpage
    1301
  • Lastpage
    1316
  • Abstract
    The effectiveness of a random built-in self-test technique for VLSI circuits is studied. This technique, called the circular self-test path (CSTP), is applicable to circuits that consist of combinational blocks and registers. In particular, the effectiveness of test pattern generation, the effectiveness of test response compaction and fault coverage are examined. The test generation effectiveness is evaluated by the fraction of all possible test patterns applied during a testing session to the circuit under test. The compaction effectiveness of the CSTP technique is measured by the probability of aliasing, and fault coverage by the fraction of all permanent faults that are detected. For all these measures, simple formulas are developed, which give very accurate estimations without detailed circuit simulation. To demonstrate their accuracy, the estimates obtained by the formulas are compared to the results obtained by extensive simulation experiments
  • Keywords
    VLSI; built-in self test; integrated circuit testing; integrated logic circuits; logic testing; probability; VLSI circuits; aliasing; built-in self-test; circular self-test path technique; combinational blocks; fault coverage; probability; random BIST; test pattern generation; test response compaction; testing effectiveness; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Compaction; Electrical fault detection; Registers; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.170992
  • Filename
    170992