DocumentCode :
788655
Title :
The lumped-charge power MOSFET model, including parameter extraction
Author :
Budihardjo, Irwan ; Lauritzen, Peter O.
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Volume :
10
Issue :
3
fYear :
1995
fDate :
5/1/1995 12:00:00 AM
Firstpage :
379
Lastpage :
387
Abstract :
A fundamentally new, physically-based power MOSFET model features continuous and accurate curves for all three interelectrode capacitances. The model equations are derived from the charge stored on two internal nodes and the three external terminals. A straightforward parameter extraction technique uses the standard gate-charge plot or process data and is matched with interelectrode capacitance measurements. Simulations are in excellent agreement with measurements. The model is used to design a snubber for a flyback converter
Keywords :
capacitance measurement; circuit analysis computing; digital simulation; power MOSFET; power convertors; protection; semiconductor device models; snubbers; SPICE; external terminals; flyback converter; interelectrode capacitances; internal nodes; lumped-charge power MOSFET model; model equations; parameter extraction; parameter extraction technique; process data; snubber; standard gate-charge plot; stored charge; Capacitance measurement; Equations; FETs; MOSFET circuits; Measurement standards; Parameter extraction; Power MOSFET; Senior members; Snubbers; Voltage;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/63.388005
Filename :
388005
Link To Document :
بازگشت