• DocumentCode
    788697
  • Title

    Affine invariant pattern recognition using multiscale autoconvolution

  • Author

    Rahtu, Esa ; Salo, Mikko ; Heikkilä, Janne

  • Author_Institution
    Dept. of Electr. & Inf. Eng., Oulu Univ., Finland
  • Volume
    27
  • Issue
    6
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    908
  • Lastpage
    918
  • Abstract
    This paper presents a new affine invariant image transform called multiscale autoconvolution (MSA). The proposed transform is based on a probabilistic interpretation of the image function. The method is directly applicable to isolated objects and does not require extraction of boundaries or interest points, and the computational load is significantly reduced using the fast Fourier transform. The transform values can be used as descriptors for affine invariant pattern classification and, in this article, we illustrate their performance in various object classification tasks. As shown by a comparison with other affine invariant techniques, the new method appears to be suitable for problems where image distortions can be approximated with affine transformations.
  • Keywords
    convolution; fast Fourier transforms; image segmentation; pattern classification; affine invariant pattern recognition; fast Fourier transform; image distortion; multiscale autoconvolution; pattern classification; Books; Fast Fourier transforms; Fourier transforms; Image converters; Multiresolution analysis; Object recognition; Pattern classification; Pattern recognition; TV; Wavelet transforms; Index Terms- Affine invariance; affine invariant features; image transforms.; object recognition; pattern classification; target identification; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Models, Statistical; Pattern Recognition, Automated; Statistics as Topic;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2005.111
  • Filename
    1424456