• DocumentCode
    788778
  • Title

    Survivability Studies of Lithium Drifted Silicon Detectors under Severe Environmental Conditions

  • Author

    Hubbard, E.L.

  • Author_Institution
    Philco-Ford Corporation Palo Alto, California
  • Volume
    15
  • Issue
    4
  • fYear
    1968
  • Firstpage
    14
  • Lastpage
    20
  • Abstract
    Several lithium drifted silicon, surface barrier detectors were subjected to a variety of environmental conditions. The conditions were primarily those of long term storage under ambient temperature conditions and of long time operation under both ambient and high (+60°C) temperature operation. Use was made of the temperature dependence of the diffusion coefficient of lithium in silicon so that elevated temperatures could be used to decrease the time scale of the tests. Some detectors were also subjected to a series of vibration and shock tests. The entire set of tests was performed in an effort to see if the detectors could withstand the rigors of the Apollo mission. The results of all the tests are given in the paper.
  • Keywords
    Detectors; Lithium; Performance evaluation; Phase detection; Semiconductor device noise; Silicon; Solid state circuits; Temperature dependence; Testing; Working environment noise;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1968.4324998
  • Filename
    4324998