Title :
Kink-free design of submicrometer MRAM cell
Author :
Lee, K.J. ; Park, Wanjun ; Kim, Taewan
Author_Institution :
Storage Lab., Samsung Adv. Inst. of Technol., Suwon, South Korea
Abstract :
Full micromagnetic simulations have been performed to investigate the origin of a kink in a magnetoresistive curve and to design a kink-free magnetoresistive random access memory (MRAM) cell. The kink in an at-field curve can originate from the 2π-wall or the vortex formation, which is strongly dependent on the magnetic properties and the geometry of a free layer. The kink originating from the 2π-wall formation was found to disappear in a remanent magnetization curve; therefore, it should not affect the selectivity of a MRAM array. It turned out that the vortex formation was the major origin of the kink when the free layer has the high saturation magnetization and the thick layer thickness. This vortex state is a local minimum state even after removing the external field. Finally, we found kink-free criteria for various saturation magnetizations, thicknesses, and aspect ratios of a free layer.
Keywords :
magnetic storage; magnetisation; magnetoresistive devices; micromagnetics; random-access storage; remanence; aspect ratios; high saturation magnetization; kink-free design; kink-free magnetoresistive random access memory cell; magnetic properties; magnetoresistive curve; micromagnetic simulations; remanent magnetization curve; saturation magnetizations; submicrometer MRAM cell; thick layer thickness; vortex formation; vortex state; Anisotropic magnetoresistance; Demagnetization; Magnetic anisotropy; Magnetic properties; Metastasis; Micromagnetics; Perpendicular magnetic anisotropy; Random access memory; Saturation magnetization; Shape;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2003.816240