DocumentCode
789229
Title
Spin-valve and pseudo-spin-valve device switching for giant magnetoresistive random access memory applications
Author
Katti, R.R. ; Zou, D. ; Reed, D. ; Kaakani, H.
Author_Institution
Solid State Electron. Center, Honeywell Int. Inc., Plymouth, MN, USA
Volume
39
Issue
5
fYear
2003
Firstpage
2848
Lastpage
2850
Abstract
Previous work has described the performance of current-in-plane (CIP) pseudo-spin-valve (PSV) devices for giant magnetoresistive random access memory (GMRAM) applications for 1R0T GMRAM architectures based on a bit cell containing a GMR resistor and no transistors. Device characteristics are reported here of CIP spin-valve (SV) and PSV devices that can be applied to GMRAM two-resistor/two-transistor (2R2T) latch memory architectures. As a function of hard-axis in-plane bias field, the PSV and SV devices have switching field and dR dependencies that are opposite in sign, which indicate differences in the magnetization reversal process between PSV and SV devices. For easy-axis fields that exceed the storage layer switching field but are less than the pinned-layer reversal field, PSV devices have two layers that respond to applied fields while SV devices have a single layer that responds. The PSV device, therefore, shows an additional effect of mutual magnetization coupling between the two magnetic layers, while the SV device acts more simply, as a biased single layer.
Keywords
flip-flops; giant magnetoresistance; magnetic storage; magnetic switching; magnetisation reversal; magnetoresistive devices; random-access storage; spin valves; bit cell; current-in-plane devices; device characteristics; giant magnetoresistive random access memory applications; hard-axis in-plane bias field; magnetization reversal process; pinned-layer reversal field; pseudo-spin-valve device switching; spin-valve; storage layer switching field; two-resistor/two-transistor latch memory architectures; Giant magnetoresistance; Iron; Latches; Magnetic devices; Magnetic multilayers; Magnetic separation; Magnetic switching; Magnetization; Random access memory; System testing;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2003.816242
Filename
1233236
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