• DocumentCode
    789229
  • Title

    Spin-valve and pseudo-spin-valve device switching for giant magnetoresistive random access memory applications

  • Author

    Katti, R.R. ; Zou, D. ; Reed, D. ; Kaakani, H.

  • Author_Institution
    Solid State Electron. Center, Honeywell Int. Inc., Plymouth, MN, USA
  • Volume
    39
  • Issue
    5
  • fYear
    2003
  • Firstpage
    2848
  • Lastpage
    2850
  • Abstract
    Previous work has described the performance of current-in-plane (CIP) pseudo-spin-valve (PSV) devices for giant magnetoresistive random access memory (GMRAM) applications for 1R0T GMRAM architectures based on a bit cell containing a GMR resistor and no transistors. Device characteristics are reported here of CIP spin-valve (SV) and PSV devices that can be applied to GMRAM two-resistor/two-transistor (2R2T) latch memory architectures. As a function of hard-axis in-plane bias field, the PSV and SV devices have switching field and dR dependencies that are opposite in sign, which indicate differences in the magnetization reversal process between PSV and SV devices. For easy-axis fields that exceed the storage layer switching field but are less than the pinned-layer reversal field, PSV devices have two layers that respond to applied fields while SV devices have a single layer that responds. The PSV device, therefore, shows an additional effect of mutual magnetization coupling between the two magnetic layers, while the SV device acts more simply, as a biased single layer.
  • Keywords
    flip-flops; giant magnetoresistance; magnetic storage; magnetic switching; magnetisation reversal; magnetoresistive devices; random-access storage; spin valves; bit cell; current-in-plane devices; device characteristics; giant magnetoresistive random access memory applications; hard-axis in-plane bias field; magnetization reversal process; pinned-layer reversal field; pseudo-spin-valve device switching; spin-valve; storage layer switching field; two-resistor/two-transistor latch memory architectures; Giant magnetoresistance; Iron; Latches; Magnetic devices; Magnetic multilayers; Magnetic separation; Magnetic switching; Magnetization; Random access memory; System testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2003.816242
  • Filename
    1233236