• DocumentCode
    789308
  • Title

    Effect of Temperature on Microcircuit Radiation Response

  • Author

    Johnston, Allan H. ; Bowman, William C.

  • Author_Institution
    The Boeing Company Seattle, Washington
  • Volume
    15
  • Issue
    6
  • fYear
    1968
  • Firstpage
    232
  • Lastpage
    238
  • Abstract
    The effect of temperature on the primary photocurrent of the base-collector and collector-substrate junctions of isolated transistors from three types of microcircuits was investigated over the temperature range -50° C to 125° C. Only small changes in base-collector primary photocurrent were observed, whereas collector-substrate primary photocurrent increased by a factor of three to five with decreasing temperature. The temperature dependence of the transient response of two microcircuits near the failure threshold is analyzed and shown to depend on the temperature dependence of primary photocurrent and transistor electrical parameters.
  • Keywords
    Aluminum; Circuits; Photoconductivity; Pulse measurements; Temperature control; Temperature dependence; Temperature distribution; Temperature measurement; Transient response; Wiring;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1968.4325052
  • Filename
    4325052