DocumentCode
789308
Title
Effect of Temperature on Microcircuit Radiation Response
Author
Johnston, Allan H. ; Bowman, William C.
Author_Institution
The Boeing Company Seattle, Washington
Volume
15
Issue
6
fYear
1968
Firstpage
232
Lastpage
238
Abstract
The effect of temperature on the primary photocurrent of the base-collector and collector-substrate junctions of isolated transistors from three types of microcircuits was investigated over the temperature range -50° C to 125° C. Only small changes in base-collector primary photocurrent were observed, whereas collector-substrate primary photocurrent increased by a factor of three to five with decreasing temperature. The temperature dependence of the transient response of two microcircuits near the failure threshold is analyzed and shown to depend on the temperature dependence of primary photocurrent and transistor electrical parameters.
Keywords
Aluminum; Circuits; Photoconductivity; Pulse measurements; Temperature control; Temperature dependence; Temperature distribution; Temperature measurement; Transient response; Wiring;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1968.4325052
Filename
4325052
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